Ni, Z., Lee, P. S., Shen, Z., Kasim, J., Tee, X. Y., You, Y. M., . . . Engineering, S. o. M. S. &. (2012). Plasmon-enhanced polarized Raman spectroscopy for sensitive surface characterization.

Ni, Zhenhua, Pooi See Lee, Zexiang Shen, J. Kasim, X. Y. Tee, Y. M. You, Y. Setiawan, L. Chan, و School of Materials Science & Engineering. Plasmon-enhanced Polarized Raman Spectroscopy for Sensitive Surface Characterization. 2012.

Ni, Zhenhua, et al. Plasmon-enhanced Polarized Raman Spectroscopy for Sensitive Surface Characterization. 2012.