Non-heuristic automatic techniques for overcoming low signal-to-noise-ratio bias of localization microscopy and multiple signal classification algorithm

Localization microscopy and multiple signal classification algorithm use temporal stack of image frames of sparse emissions from fluorophores to provide super-resolution images. Localization microscopy localizes emissions in each image independently and later collates the localizations in all the fr...

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Main Authors: Agarwal, Krishna, Macháň, Radek, Prasad, Dilip Kumar
其他作者: School of Computer Science and Engineering
格式: Article
語言:English
出版: 2018
主題:
在線閱讀:https://hdl.handle.net/10356/87383
http://hdl.handle.net/10220/45392
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