HRTEM image simulation of rhenium (VI) oxide using multislice technique
As defects and impurities are present in all materials, High Resolution Transmission Electron Microscopy (HRTEM) images of materials recorded experimentally from Transmission Electron Microscope (TEM) usually contains artefacts. Artefacts make the interpretation of the experimentally recorded HRTEM...
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| 格式: | Final Year Project |
| 語言: | English |
| 出版: |
2012
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| 在線閱讀: | http://hdl.handle.net/10356/48442 |
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| 機構: | Nanyang Technological University |
| 語言: | English |