APA引文

Du, X., & Bihan, W. (2022). Deep learning for anomaly detection in computational imaging. Nanyang Technological University.

Chicago Style Citation

Du, Xinglin, and Wen Bihan. Deep Learning for Anomaly Detection in Computational Imaging. Nanyang Technological University, 2022.

MLA引文

Du, Xinglin, and Wen Bihan. Deep Learning for Anomaly Detection in Computational Imaging. Nanyang Technological University, 2022.

警告：這些引文格式不一定是100％准確.